ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,721, issued on April 21, was assigned to SICK AG (Waldkirch, Germany). "Optoelectronic sensor" was invented by Christoph Menzel (Denzlinge... Read More
ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,722, issued on April 21, was assigned to Rayz Technologies Co. Ltd. (Yancheng, China). "Optical waveguide device used in laser detection a... Read More
ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,723, issued on April 21, was assigned to TRUPIXEL INC. (Daejeon, South Korea). "Single photon detector, electronic device, and LiDAR devic... Read More
ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,724, issued on April 21, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea). "Object detection device and operating meth... Read More
ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,725, issued on April 21, was assigned to Sony Semiconductor Solutions Corp. (Kanagawa, Japan). "Light receiving device and range-finding d... Read More
ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,726, issued on April 21, was assigned to Ningbo ABAX Sensing Electronic Technology Co. Ltd. (Ningbo City, China). "Detection method and de... Read More
ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,727, issued on April 21, was assigned to CIENA Corp. (Hanover, Md.). "Method and apparatus for detecting and/or identifying objects" was i... Read More
ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,728, issued on April 21, was assigned to ROBERT BOSCH GMBH (Stuttgart, Germany). "LIDAR system and method for recognizing a contamination ... Read More
ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,729, issued on April 21, was assigned to Horiba Europe GmbH (Darmstadt, Germany). "Test system for testing a LIDAR device" was invented by... Read More
ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,730, issued on April 21, was assigned to AEVA INC. (Mountain View, Calif.). "Techniques for scan pattern beam alignment" was invented by K... Read More